Mr. Guido Straube Profile

Guido Straube

at TU Ilmenau

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 18 June 2024 Poster + Paper

OpenRRI: theory and application of open-source interferometry

Guido Straube, Christoph Hemeling, Folker Schwesinger, Vitalii Shmagun, Alexander Barth, Juan Sebastian Fischer Calderón, Thomas Kissinger

Proceedings Volume 12997, 129971L (2024) https://doi.org/10.1117/12.3022784

KEYWORDS: Interferometers, Laser interferometry, Modulation, Photodetectors, Semiconductor lasers, Reflection, Signal processing, Demodulation, Data acquisition, Signal detection

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Proceedings Article | 18 June 2024 Poster + Paper

Differential confocal microscopy for stable scanning-microsphere assisted direct laser writing

Johannes Belkner, Jaqueline Stauffenberg, Guido Straube, Ingo Ortlepp, Thomas Kissinger, Eberhard Manske

Proceedings Volume 12997, 129971I (2024) https://doi.org/10.1117/12.3022472

KEYWORDS: Microspheres, Confocal microscopy, Light sources and illumination, Refractive index, Photoresist materials, Signal processing, Objectives, Microscopes

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Proceedings Article | 4 October 2023 Presentation + Paper

Absolute determination of a large mirror surface from spatial gradients using a coordinate measuring machine

Sebastian Fischer Calderón, Rostyslav Mastylo, Christian Schober, Christof Pruss, Ingo Ortlepp, Guido Straube, Eberhard Manske

Proceedings Volume 12672, 1267205 (2023) https://doi.org/10.1117/12.2675734

KEYWORDS: Optical surfaces, Reconstruction algorithms, Mirrors, Motion measurement, Metrology, Matrices, Simulations, Optical spheres, Measurement uncertainty

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Proceedings Article | 17 September 2019 Open Access

Modelling and calibration of multi-camera-systems for 3D industrial supervision applications

Guido Straube, Chen Zhang, Artem Yaroshchuk, Steffen Lübbecke, Gunther Notni

Proceedings Volume 11144, 111440D (2019) https://doi.org/10.1117/12.2532320

KEYWORDS: Cameras, Calibration, Distortion, Clouds, 3D image processing, 3D modeling, Imaging systems, Image processing, Modeling, 3D applications

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