Mr. James J. Pao Profile

James J. Pao

at OEpic Semiconductors Inc

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Publications (2)

Proceedings Article | 28 February 2017 Paper

Reliability and manufacturability of 25G VCSELs with oxide apertures formed by in-situ monitoring

James Pao, Ta-Chung Wu, Wilson Kyi, Majid Riaziat, James Lott

Proceedings Volume 10115, 1011519 (2017) https://doi.org/10.1117/12.2253565

KEYWORDS: Semiconductors, Oxides, Quantum wells, Manufacturing, Reliability, Resistance, Oxygen, Process control, Picosecond phenomena, Vertical cavity surface emitting lasers, Semiconducting wafers, Atmospheric propagation, Oxidation

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Proceedings Article | 25 February 2017 Presentation + Paper

Tunnel junction 850-nm VCSEL for aperture uniformity and reliability

P. S. Wong, J. Yan, T. C. Wu, W. Kyi, J. Pao, M. Riaziat

Proceedings Volume 10122, 101220B (2017) https://doi.org/10.1117/12.2253053

KEYWORDS: Semiconductors, Gallium arsenide, Reliability, Doping, Vertical cavity surface emitting lasers, Tellurium

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