Jeffrey A. McCausland
Postdoc Fellow
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2019 Paper
Proceedings Volume 11371, 1137104 (2019) https://doi.org/10.1117/12.2531767
KEYWORDS: Graphene, Atomic force microscopy, Chemical vapor deposition, Thin films, Carbon, Surface roughness, Capillaries, Fluorine, Chemical species, Humidity

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