Carrier gratings are generally used to carry the spatial information about surfaces to be inspected and spatial information demodulated using phase shifting methods. Phase shifting methods need more than one image to demodulate the phase information and hence the spatial information of the object. In this paper we propose a method to inspect surfaces by projecting grating patterns on surfaces and Radon transforming the images. Fringe inclination is used as an estimator for locating surface defects.
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