Mr. Michael A. Soel Profile

Michael A. Soel

Sr. Technical Director, Systems & Technology at Teledyne FLIR, Defense

SPIE Involvement:

Conference Program Committee | Author

Area of Expertise:

Infrared Systems Engineering , Optical Systems Engineering , Atmospheric Phenomenology , EO/IR Sensors , Sensor Modeling , Sensor Testing

Proceedings Article | 14 May 2019 Paper

30 years of value engineering to the IR community

Michael Soel

Proceedings Volume 11001, 1100102 (2019) https://doi.org/10.1117/12.2520503

KEYWORDS: Systems modeling, Sensors, Electro optical modeling, Imaging systems, Analytical research, Infrared imaging, Performance modeling, Sensor performance, Thermal modeling, Systems engineering

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SPIE Journal Paper | 1 August 2003

Information differences between subbands of the mid-wave infrared spectrum

Steve Moyer, Ronald Driggers, Richard Vollmerhausen, Michael Soel, Gisele Welch, William Rhodes

OE, Vol. 42, Issue 08, (August 2003) https://doi.org/10.1117/12.10.1117/1.1589027

KEYWORDS: Sensors, Optical filters, Black bodies, Image segmentation, Mid-IR, Atmospheric optics, Signal to noise ratio, Image filtering, Imaging systems, Target detection

Proceedings Article | 29 July 2002 Paper

InSb versus QWIP imaging sensors: a comparison in progress

Michael Soel, Robert Benson, Charles Confer

Proceedings Volume 4719, (2002) https://doi.org/10.1117/12.477477

KEYWORDS: Sensors, Quantum well infrared photodetectors, Medium wave, Infrared sensors, Surveillance, Atmospheric sensing, Atmospheric modeling, Target detection, Sensor technology, Image sensors

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Proceedings Article | 29 July 2002 Paper

Mid-wave infrared target source characteristics for focal plane applications

Steven Moyer, Ronald Driggers, Richard Vollmerhausen, Michael Soel, Penny Warren, Gisele Welch, William Rhodes

Proceedings Volume 4719, (2002) https://doi.org/10.1117/12.477476

KEYWORDS: Sensors, Image segmentation, Black bodies, Imaging systems, Signal to noise ratio, Mid-IR, Calibration, Infrared sensors, Atmospheric optics, Optical filters

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Proceedings Article | 29 July 2002 Paper

High-end infrared imaging sensor evaluation system

Michael Soel, Alan Irwin, Patti Gaultney, Stephen White, Stephen McHugh

Proceedings Volume 4719, (2002) https://doi.org/10.1117/12.477456

KEYWORDS: Sensors, Infrared imaging, Modulation transfer functions, Forward looking infrared, Imaging systems, Infrared sensors, Thermography, Minimum resolvable temperature difference, Infrared cameras, Image sensors

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Proceedings Article | 16 June 1997 Paper

Multiview: a novel multispectral IR imaging camera

Michael Soel, Stanley Rudman, Robert Ryan, Nils Fonneland, Steve Milano

Proceedings Volume 3063, (1997) https://doi.org/10.1117/12.276074

KEYWORDS: Sensors, Staring arrays, Image registration, Cameras, Optical filters, Multispectral imaging, Imaging systems, Image sensors, Target detection, Black bodies

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Proceedings Article | 1 September 1991 Paper

Transient radiometric measurements with a PtSi IR camera

Wayne Konopka, Michael Soel, Anthony Celentano, V. Calia

Proceedings Volume 1488, (1991) https://doi.org/10.1117/12.45816

KEYWORDS: Cameras, Signal to noise ratio, Frame grabbers, Electrons, Imaging systems, Camera shutters, Systems modeling, Interference (communication), Calibration, Radio optics

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Showing 5 of 7 publications

Conference Committee Involvement (22)

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXVI

13 April 2025 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV

23 April 2024 | National Harbor, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV

3 May 2023 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII

6 April 2022 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII

12 April 2021 | Online Only, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI

27 April 2020 | Online Only, California, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX

16 April 2019 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX

17 April 2018 | Orlando, FL, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII

11 April 2017 | Anaheim, CA, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII

19 April 2016 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI

21 April 2015 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV

6 May 2014 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV

30 April 2013 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII

24 April 2012 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII

26 April 2011 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI

6 April 2010 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX

14 April 2009 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX

18 March 2008 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII

11 April 2007 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII

19 April 2006 | Orlando (Kissimmee), Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI

30 March 2005 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV

14 April 2004 | Orlando, Florida, United States

Showing 5 of 22 Conference Committees

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