CONFERENCE PROCEEDINGS
Advanced Search
Mirko Fornasier
at Univ. degli Studi di Padova
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 15 March 2023 Presentation + Paper
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
M. Zenari, M. Buffolo, M. Fornasier, C. De Santi, J. Goyvaerts, A. Grabowski, J. Gustavsson, S. Kumari, A. Stassen, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini
Proceedings Volume 12439, 124390E (2023) https://doi.org/10.1117/12.2655696
KEYWORDS: Photonic integrated circuits, Diffusion, Resistance, Semiconductor lasers, Vertical cavity surface emitting lasers, Integrated optics
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top