Naoya Hasebe
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2015 Paper
Proceedings Volume 9443, 944330 (2015) https://doi.org/10.1117/12.2179753
KEYWORDS: Image analysis, Machine vision, Computer vision technology, Error analysis, Statistical analysis, Cameras, Light sources, Reflectivity, Visual process modeling, Object recognition

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