Tianwei Lan
at Liaoning Technical Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 August 2010 Paper
T. W. Lan, H. W. Zhang, Y. Chen, X. Ren
Proceedings Volume 7820, 78202K (2010) https://doi.org/10.1117/12.866219
KEYWORDS: Mining, Pattern recognition, Analytical research, Safety, Digital image processing, Optical character recognition, System identification, Mathematical modeling, Statistical modeling, Databases

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