Prof. Yoshio Honda
at Nagoya Univ
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295534 (2024) https://doi.org/10.1117/12.3010733
KEYWORDS: Scanning electron microscopy, Electron beams, Feedback control, Signal detection, Semiconductors, Metrology, Scanning

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295533 (2024) https://doi.org/10.1117/12.3010730
KEYWORDS: Electron beams, Semiconductors, Scanning electron microscopy, Transmission electron microscopy, Laser irradiation, Semiconductor materials, Group III-V semiconductors, Electron microscopes, Vacuum

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295529 (2024) https://doi.org/10.1117/12.3009947
KEYWORDS: Scanning electron microscopy, Electron beams, Field effect transistors, Transistors, Metrology, Inspection, Electrical conductivity

Proceedings Article | 9 March 2024 Presentation
Proceedings Volume PC12886, PC1288602 (2024) https://doi.org/10.1117/12.3004144
KEYWORDS: Gallium nitride, Laser induced damage, Field effect transistors, Fabrication, Contamination

Proceedings Article | 26 September 2023 Presentation
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2650922
KEYWORDS: Semiconductor lasers, Continuous wave operation, Cladding, Waveguides, Resistance, Refractive index, Aluminum, Quantum wells, Optical design, Active optics

Showing 5 of 18 publications
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