Yanqing Shi
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 October 2021 Paper
Proceedings Volume 11899, 1189909 (2021) https://doi.org/10.1117/12.2600851
KEYWORDS: Specular reflections, Mirrors, LCDs, Fringe analysis, Cameras, 3D metrology, Calibration, Deflectometry

SPIE Journal Paper | 17 February 2021 Open Access
OE, Vol. 60, Issue 02, 020903, (February 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.2.020903
KEYWORDS: 3D metrology, LCDs, Fringe analysis, Deflectometry, Calibration, Error analysis, Reflectivity, Imaging systems, Cameras, Optical engineering

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top