Yujie Xu
at Hitachi High-Tech Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 February 2021 Poster + Presentation + Paper
Proceedings Volume 11611, 116112I (2021) https://doi.org/10.1117/12.2583545

Proceedings Article | 20 March 2020 Paper
Proceedings Volume 11325, 113252Z (2020) https://doi.org/10.1117/12.2552057
KEYWORDS: Transmission electron microscopy, Calibration, Semiconducting wafers, Electron microscopes, Fin field effect transistors, Image filtering, Scanning electron microscopy, Etching, Image quality, Integrated circuits, Deep ultraviolet, 193nm lithography, Electro optical systems calibration, Precision measurement, Accuracy assessment

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