In this paper, we present a new technology to enhance the sensitivity by absorbing part of the light at the entry of the Z-scan system. Compared to the top-hat Z-scan, the curves of the modified top-hat Z-scan for the nonlinear refraction show higher peak-to-valley values, which mean higher sensitivity with our modified method. Nonlinear refraction of CS2 is investigated using this technique with 19ps pulses at wavelength of 532 nm.
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