Prof. Bongtae Han
Professor at Univ of Maryland College Park
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | 1 October 2009
Changsoo Jang, Arindam Goswami, Bongtae Han, Suk-Jin Ham
JM3, Vol. 8, Issue 04, 043025, (October 2009) https://doi.org/10.1117/12.10.1117/1.3227904
KEYWORDS: Diffusion, Polymers, Microelectromechanical systems, In situ metrology, Optical testing, Fringe analysis, Calibration, Helium, Interferometry, Finite element methods

Proceedings Article | 9 February 2009 Paper
Changsoo Jang, Arindam Goswami, Bongtae Han
Proceedings Volume 7206, 720607 (2009) https://doi.org/10.1117/12.810001
KEYWORDS: Polymers, Diffusion, Optical testing, Microelectromechanical systems, Fringe analysis, Helium, Calibration, Interferometry, Oxygen, Temperature metrology

Proceedings Article | 9 February 2009 Paper
Changsoo Jang, Byeng Dong Youn, Suk-Jin Ham, Bongtae Han
Proceedings Volume 7206, 720605 (2009) https://doi.org/10.1117/12.810004
KEYWORDS: Helium, Data modeling, Microelectromechanical systems, Diffusion, Inspection, Spectroscopy, Analytical research, Molecules, Palladium, Error analysis

SPIE Journal Paper | 1 February 2005
Changwoon Han, Bongtae Han
OE, Vol. 44, Issue 02, 028002, (February 2005) https://doi.org/10.1117/12.10.1117/1.1849221
KEYWORDS: Cameras, Diffraction, Fringe analysis, Diffraction gratings, Optical engineering, Moire patterns, Distance measurement, Light sources, Ronchi rulings, Imaging systems

SPIE Journal Paper | 1 April 2004
Michael Mello, Bongtae Han, Zhaoyang Wang
OE, Vol. 43, Issue 04, (April 2004) https://doi.org/10.1117/12.10.1117/1.1666861
KEYWORDS: Diffraction, Wavefronts, Interferometry, Interferometers, Infrared radiation, Diffraction gratings, Visible radiation, Surface roughness, Reflectivity, Infrared lasers

Showing 5 of 8 publications
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