X-ray diffraction texture: features for material identification (Conference Presentation)

Joshua H. Carpenter; Dean Hazineh; Michael Gehm; Joel A. Greenberg

doi:10.1117/12.2560077

27 April 2020 X-ray diffraction texture: features for material identification (Conference Presentation)

Joshua H. Carpenter, Dean Hazineh, Michael Gehm, Joel A. Greenberg

Author Affiliations +

Proceedings Volume 11404, Anomaly Detection and Imaging with X-Rays (ADIX) V; 114040J (2020) https://doi.org/10.1117/12.2560077
Event: SPIE Defense + Commercial Sensing, 2020, Online Only

Abstract

Polychromatic X-ray scatter is modulated in both angle and energy in a way that encodes a material’s crystalline texture. Various texture quantification metrics have been calculated from X-ray scatter which are typically most informative for fundamental material or crystallographic research. In this work, we quantify material crystalline texture from scatter measurements made using a tabletop energy and angle dispersive diffractometer and show that these X-ray scatter-based metrics have promise as complementary metrics to the material form factor and are particularly suited for material identification applications.

Conference Presentation

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Joshua H. Carpenter, Dean Hazineh, Michael Gehm, and Joel A. Greenberg "X-ray diffraction texture: features for material identification (Conference Presentation)", Proc. SPIE 11404, Anomaly Detection and Imaging with X-Rays (ADIX) V, 114040J (27 April 2020); https://doi.org/10.1117/12.2560077

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