Dr. Larry L. Howell Profile

Dr. Larry L. Howell

Professor at Brigham Young Univ

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Author

Publications (5)

Proceedings Article | 22 May 2015 Paper

HanaFlex: a large solar array for space applications

Shannon Zirbel, Brian Trease, Mark Thomson, Robert Lang, Spencer Magleby, Larry Howell

Proceedings Volume 9467, 94671C (2015) https://doi.org/10.1117/12.2177730

KEYWORDS: Solar energy, Solar cells, Space operations, Photovoltaics, Prototyping, Ions, Mars, Satellites, Rockets, Crystals

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Proceedings Article | 18 April 2007 Paper

Exploring the resistance change trends associated with integrated piezoresistive sensing elements

Gary Johns, Tyler Waterfall, Larry Howell, Brian Jensen, Timothy McLain

Proceedings Volume 6529, 652938 (2007) https://doi.org/10.1117/12.716232

KEYWORDS: Resistance, Data modeling, Superposition, Sensors, Piezoresistive sensors, Systems modeling, Instrument modeling, Microelectromechanical systems, Mechanical sensors, Structural design

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Proceedings Article | 10 April 2007 Paper

Piezoresistive in-line integrated force sensors for on-chip measurement and control

Kendall Teichert, Tyler Waterfall, Brian Jensen, Larry Howell, Tim McLain

Proceedings Volume 6529, 65292E (2007) https://doi.org/10.1117/12.716234

KEYWORDS: Sensors, Resistance, Data modeling, Silicon, Protactinium, Mechanical sensors, Biosensing, Sensing systems, Thermal sensing, Microactuators

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Proceedings Article | 5 April 2006 Paper

Piezoresistive feedback for improving transient response of MEMS thermal actuators

Rob Messenger, Timothy McLain, Larry Howell

Proceedings Volume 6174, 617408 (2006) https://doi.org/10.1117/12.657954

KEYWORDS: Sensors, Microelectromechanical systems, Resistance, Actuators, Feedback control, Control systems, Lead, Control systems design, Signal to noise ratio, Capacitance

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SPIE Journal Paper | 1 October 2005

Polymer stretching to produce flat suspended micromembranes

Kevin Campbell, Jacey Morine, Zachary George, Craig Lusk, Larry Howell, Stephen Schultz, Aaron Hawkins

JM3, Vol. 4, Issue 04, 043005, (October 2005) https://doi.org/10.1117/12.10.1117/1.2075267

KEYWORDS: Polymers, Aluminum, Silicon, Etching, Profilometers, Reflection, RGB color model, Heat treatments, Microelectromechanical systems

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