In this paper,the liquid-based scattering microspheres phantom is studied, in order to evaluate the resolution of optical coherence tomography (OCT) equipment. By mixing pure water and polystyrene (PS) microspheres in proportion to fabricate solutions of different concentrations. The disadvantages of polydimethylsiloxane (PDMS) substrates are overcame, such as complex production process, microbubbles, uneven distribution or clustering of microspheres, easy tearing, and relatively low imaging contrast. The encapsulated liquid-based scattering microspheres phantom is characterized by optical microscopy, which shows that the microspheres are uniformly distributed without clustering. It can effectively improve the accuracy of resolution evaluation of OCT equipment. At the same time, the automatic identification, averaging and fitting of microspheres in OCT test images are realized by programming, and the evaluation results of lateral and axial resolutions are given automatically. Finally, the liquid-based evaluation phantom is validated by testing the resolutions of a commercial OCT equipment.
In this paper, a set of geometric parameters metrology system for contact lens based on SD-OCT (Spectral domain-optical coherence tomography) is developed and optimized, which can dealing with difficulties in measuring geometric parameters of contact lens, especially those with complex structures and surface shapes. Dispersion compensation, SNR(Signal-to-noise ratio) improvement and error compensation are introduced to improve the measurement accuracy. What’s more, the developed system is calibrated according to JJF 1148-2006. After calibration, the system meets the following indicators: test range of diameter: 8 mm-16 mm, indication error: ±50 μm; test range of center thickness: 0mm-1 mm, indication error: ±5 μm; test range of curvature radius: 6.5 mm-9.5 mm, indication error: ±20μm, repeatability of measurement: 10 μm. In addition, key parameters of a rigid contact lens with complex structure are measured, including diameter, vector height and center thickness, which can be recognized and measured automatically.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.