Dr. Zijian Du
at ASML
SPIE Involvement:
Author
Area of Expertise:
image processing , neural network , software engineering , computer vision , machine learning , generative model
Profile Summary

machine learning/computer vision based advanced algorithm development for SEM image quality enhancement, restoration, contour based metrology, outlier detection/classification and data analysis of complex data
Publications (2)

SPIE Journal Paper | 21 August 2023 Open Access
JM3, Vol. 22, Issue 03, 034201, (August 2023) https://doi.org/10.1117/12.10.1117/1.JMM.22.3.034201
KEYWORDS: Image restoration, Metrology, Scanning electron microscopy, Image processing, Image quality, Neural networks, Education and training, Tunable filters, Machine learning, Line edge roughness

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12053, 1205309 (2022) https://doi.org/10.1117/12.2614281
KEYWORDS: Convolutional neural networks, Computer vision technology, Machine learning, Image restoration, Image quality, Metrology, Scanning electron microscopy, Image processing, Image enhancement, Denoising, Neural networks, Data modeling, Time metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top