Prof. Jonathan M. Huntley
Emeritus Professor at Loughborough Univ
SPIE Involvement:
Author
Publications (44)

Proceedings Article | 11 January 2023 Presentation + Paper
C. Coggrave, P. Ruiz, J. Huntley, C. Nolan, A. Gribble, H. Du, M. Banakar, X. Yan, D. Tran, C. Littlejohns
Proceedings Volume 12334, 1233406 (2023) https://doi.org/10.1117/12.2647526
KEYWORDS: Optical switching, Photonic integrated circuits, Distance measurement, Interferometers, Calibration, Waveguides, Beam path, Tunable lasers, Switches, Silicon

Proceedings Article | 20 May 2022 Presentation + Paper
Proceedings Volume 12137, 1213703 (2022) https://doi.org/10.1117/12.2626785
KEYWORDS: Waveguides, Solid state electronics, Interferometry, Manufacturing, Distance measurement, Calibration, Short wave infrared radiation, Silicon photonics, Refractive index, Wavelength tuning

Proceedings Article | 1 April 2020 Presentation + Paper
W. Guo, C. Coggrave, J. Huntley, H. Dantanarayana, P. Ruiz
Proceedings Volume 11352, 113520F (2020) https://doi.org/10.1117/12.2556471
KEYWORDS: Binary data, Point spread functions, Projection systems, Fringe analysis, Cameras, Manufacturing, Digital micromirror devices, Phase shifts, Robot vision, 3D vision

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10334, 103340D (2017) https://doi.org/10.1117/12.2270197
KEYWORDS: Manufacturing, Mathematical modeling, Object recognition, Control systems, Factor analysis, 3D metrology, Clouds, 3D modeling, Machine vision, Data modeling, Detection and tracking algorithms, 3D image processing

Proceedings Article | 26 June 2017 Paper
Pablo Ruiz, Jonathan Huntley
Proceedings Volume 10329, 103290G (2017) https://doi.org/10.1117/12.2272003
KEYWORDS: Fourier transforms, Mirrors, Personal digital assistants, Imaging systems, Fiber Bragg gratings, Microlens array, Interferometry, Distance measurement, Modulation, Speckle, Light, Hyperspectral imaging

Showing 5 of 44 publications
Conference Committee Involvement (2)
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Laser Interferometry X: Techniques and Analysis
31 July 2000 | San Diego, CA, United States
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