Mr. Bradley R. Williams Profile

Bradley R. Williams

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Author

Publications (8)

Proceedings Article | 10 April 2024 Presentation

The FabSCIL platform: 200 and 300mm full wafer NIL for nanophotonics

Marc Verschuuren, Bradley Williams, Mohammad Ramezani, Robert van de Laar, Jeroen Visser, Gert-Jan Hurxkens, Rob Voorkamp

Proceedings Volume PC12956, PC1295609 (2024) https://doi.org/10.1117/12.3003683

KEYWORDS: Semiconducting wafers, Nanoimprint lithography, Nanophotonics, Wafer-level optics, Scatterometry, Refractive index, Optical alignment, Metalenses, Etching, Reproducibility

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Proceedings Article | 13 March 2024 Presentation

Metalenses for visible wavelengths via NIL volume manufacturing

Matthew George, Bradley Williams, Daniel Bacon-Brown, Ricky Edwards, Stuart Johnson, Rumyana Petrova, Stew Nielson

Proceedings Volume PC12897, PC128970Q (2024) https://doi.org/10.1117/12.3003756

KEYWORDS: Nanoimprint lithography, Metalenses, Manufacturing, Etching, Sodium, Semiconducting wafers, Nanofabrication, Modulation transfer functions, Metrology, Electron beam lithography

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Proceedings Article | 13 March 2024 Presentation

NIL enabled mass production of visible meta-optics

Bradley Williams, Daniel Bacon-Brown, Matthew C. George, Rumyana Petrova, Adam Korb, Jamie Stocks

Proceedings Volume PC12898, PC128980U (2024) https://doi.org/10.1117/12.3008763

KEYWORDS: Nanoimprint lithography, Optical lithography, Manufacturing, Structural design, Semiconductors, Lithography, Infrared radiation, Industry, Industrial applications, Design and modelling

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Proceedings Article | 13 March 2024 Presentation

Visible meta-optics ready for application specific adaptation

Daniel Bacon-Brown, Matthew George, Rumyana Petrova, Stuart Johnson, Bradley Williams

Proceedings Volume PC12913, PC1291302 (2024) https://doi.org/10.1117/12.3008590

KEYWORDS: Metalenses, Industrial applications, Optical lithography, Nanoimprint lithography, Visible radiation, Semiconductor manufacturing, Manufacturing, Lithography, Design and modelling, Deep ultraviolet

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Proceedings Article | 5 October 2023 Presentation

Visible meta-optics reality: Volume production enabled by NIL

Bradley Williams, Daniel Bacon-Brown, Matthew George, Rumyana Petrova, Adam Korb, Jamie Stocks

Proceedings Volume PC12653, PC126530B (2023) https://doi.org/10.1117/12.2677387

KEYWORDS: Nanoimprint lithography, Manufacturing, Electron beam lithography, Optics manufacturing, Visible radiation, Semiconductor manufacturing, Metalenses, Lithography, High volume manufacturing, Deep ultraviolet

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Proceedings Article | 15 March 2023 Presentation + Paper

Metalenses for visible wavelengths: NIL volume manufacturing

Bradley Williams, Daniel Bacon-Brown, Ricky Edwards, Stew Nielson, Arash Farhang, Stuart Johnson, Rumyana Petrova, Matthew George, Shaun Ogden

Proceedings Volume 12432, 1243209 (2023) https://doi.org/10.1117/12.2649026

KEYWORDS: Metalenses, Nanoimprint lithography, Beam diameter, Niobium, Manufacturing, Metrology, Modulation transfer functions, Cameras, Sol gels, Design and modelling

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Proceedings Article | 21 August 2020 Presentation + Paper

Process repeatability in volume manufacturing of nanostructures utilizing nanoimprint lithography

Bradley Williams, Jim Pierce, Kevin Black, Michael Black, Daniel Bacon-Brown, Rumyana Petrova, Arash Farhang

Proceedings Volume 11467, 114670D (2020) https://doi.org/10.1117/12.2570679

KEYWORDS: Semiconducting wafers, Nanoimprint lithography, Etching, Atomic force microscopy, Manufacturing, Critical dimension metrology, Optics manufacturing, Nanostructures, Thin films

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Proceedings Article | 24 March 2020 Presentation

Characterization of defects in line/space patterns (Conference Presentation)

Vassilios Constantoudis, Bradley Williams, Nikolaos Kehagias, George Papavieros, Clivia Sotomoyor Torres, Evangelos Gogolides

Proceedings Volume 11325, 113250U (2020) https://doi.org/10.1117/12.2559411

KEYWORDS: Nanostructures, Feature extraction, Nanoimprint lithography, 3D metrology, Process control, Materials processing, Metrology, Error analysis, Scanning electron microscopy, Atomic force microscopy

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Showing 5 of 8 publications

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