Prof. Wei Gao Profile

Prof. Wei Gao

Associate Professor at Tohoku Univ

SPIE Involvement:

Conference Program Committee | Author | Editor

Publications (27)

Proceedings Article | 30 September 2024 Presentation + Paper

A dual-detection chromatic confocal probe employing a mode-locked femtosecond laser

Ryo Sato, Chen Li, Hiraku Matsukuma, Wei Gao

Proceedings Volume 13134, 1313402 (2024) https://doi.org/10.1117/12.3026365

KEYWORDS: Confocal microscopy, Mode locking, Colorimetry, Light sources, Spectral response, Signal intensity, Signal processing, Single mode fibers, Sensors

Read Abstract +

Proceedings Article | 20 September 2023 Paper

Autocollimation employing optical frequency comb

H. Matsukuma, K. Ikeda, R. Sato, W. Gao

Proceedings Volume 12607, 1260704 (2023) https://doi.org/10.1117/12.3005523

KEYWORDS: Autocollimation, Frequency combs, Mirrors, Angle measurement, Reflection, Diffraction gratings, Signal detection, Motion measurement, Laser frequency, Mirror surfaces

Read Abstract +

Proceedings Article | 17 July 2015 Paper

Fabrication of two-dimensional micro patterns for adaptive optics by using laser interference lithography

Xinghui Li, Yindi Cai, Ryo Aihara, Yuki Shimizu, So Ito, Wei Gao

Proceedings Volume 9524, 952404 (2015) https://doi.org/10.1117/12.2184829

KEYWORDS: Mirrors, Diffraction gratings, Interferometers, Lithography, Computer programming, Diffraction, Adaptive optics, Fringe analysis, Light sources, Optical fabrication

Read Abstract +

SPIE Journal Paper | 12 May 2014

Measurement of six-degree-of-freedom planar motions by using a multiprobe surface encoder

Xinghui Li, Yuki Shimizu, Takeshi Ito, Yindi Cai, So Ito, Wei Gao

OE, Vol. 53, Issue 12, 122405, (May 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122405

KEYWORDS: Computer programming, Motion measurement, Optical sensors, Sensors, Ferroelectric materials, Head, Laser beam diagnostics, Diffraction gratings, Interferometers, Prototyping

Read Abstract +

Proceedings Article | 10 October 2013 Paper

Dimensional measurement of micrometer-scale structures with a nanopipette ball probe by using shear-force detection

S. Ito, I. Kodama, W. Gao

Proceedings Volume 8916, 891609 (2013) https://doi.org/10.1117/12.2035942

KEYWORDS: Glasses, Frequency modulation, Scanning probe microscopy, Fermium, Signal attenuation, Metals, Ferroelectric materials, Sensors, Optical spheres, 3D metrology

Read Abstract +

Proceedings Article | 10 October 2013 Paper

Analysis of the forces in electrostatic force microscopy for profile measurement of micro-structured surface of dielectric

Gaofa He, Zhigang Jia, So Ito, Yuki Shimizu, Wei Gao

Proceedings Volume 8916, 891610 (2013) https://doi.org/10.1117/12.2035716

KEYWORDS: Electrodes, Scanners, Finite element methods, Microscopy, Prototyping, Resonators, Dielectrics, Dielectric polarization, Scanning probe microscopy, Atomic force microscopy

Read Abstract +

Proceedings Article | 22 June 2013 Paper

Surface form metrology of micro-optics

Bin Xu, Zhigang Jia, Xinghui Li, Yuan-Liu Chen, Yuki Shimizu, So Ito, Wei Gao

Proceedings Volume 8769, 876902 (2013) https://doi.org/10.1117/12.2019243

KEYWORDS: Micro optics, Optical scanning systems, Profiling, Lenses, Metrology, Microscopes, Computer programming, Atomic force microscopy, Diffraction, Diffraction gratings

Read Abstract +

Proceedings Article | 31 January 2013 Paper

Fabrication of diffraction gratings for surface encoders by using a Lloyd’s mirror interferometer with a 405 nm laser diode

Xinghui Li, Yuki Shimizu, So Ito, Wei Gao, Lijiang Zeng

Proceedings Volume 8759, 87594Q (2013) https://doi.org/10.1117/12.2014467

KEYWORDS: Semiconductor lasers, Diffraction gratings, Mirrors, Computer programming, Interferometers, Photoresist materials, Lithography, Atomic force microscopy, Light sources, Diffraction

Read Abstract +

Proceedings Article | 31 January 2013 Paper

Modeling and analysis of a scanning electrostatic force microscope for surface profile measurement

Zhigang Jia, Shigeaki Goto, Keiichiro Hosobuchi, So Ito, Yuki Shimizu, Wei Gao

Proceedings Volume 8759, 875914 (2013) https://doi.org/10.1117/12.2014460

KEYWORDS: Fused deposition modeling, Finite difference methods, Statistical modeling, Microscopes, Capacitance, Scanners, Spherical lenses, Prototyping, Computer simulations, Optical spheres

Read Abstract +

Proceedings Article | 16 November 2011 Paper

A glass tube micro-stylus probe for surface form metrology

Bin Xu, Yuki Shimizu, Wei Gao

Proceedings Volume 8321, 83211Z (2011) https://doi.org/10.1117/12.904875

KEYWORDS: Glasses, Sensors, Ferroelectric materials, Metrology, Actuators, Neodymium, Scanning tunneling microscopy, Tolerancing, Optical components, Atomic force microscopy

Read Abstract +

Proceedings Article | 16 November 2011 Paper

Design of a linear-rotary micro-stage

Yuxin Peng, Yasumasa Sakurai, Yoshikazu Arai, Yuki Shimizu, Wei Gao

Proceedings Volume 8321, 832121 (2011) https://doi.org/10.1117/12.904884

KEYWORDS: Ferroelectric materials, Sensors, Magnetism, Ultrasonics, Optical fibers, Electromagnetism, Optical testing, Optical engineering, Nanotechnology, Control systems

Read Abstract +

Proceedings Article | 12 January 2009 Paper

Precision measurement of scroll profiles

Y. Arai, A. Inada, W. Gao

Proceedings Volume 7133, 71330K (2009) https://doi.org/10.1117/12.807678

Read Abstract +

Proceedings Article | 12 January 2009 Paper

Nanometric edge profile measurement of cutting tools on a diamond turning machine

Takemi Asai, Yoshikazu Arai, Yuguo Cui, Wei Gao

Proceedings Volume 7133, 713314 (2009) https://doi.org/10.1117/12.807623

Read Abstract +

Proceedings Article | 12 January 2009 Paper

Compensation of motion error in a high accuracy AFM

Yuguo Cui, Yoshikazu Arai, Gaofa He, Takemi Asai, Wei Gao

Proceedings Volume 7133, 71334H (2009) https://doi.org/10.1117/12.810123

Read Abstract +

SPIE Journal Paper | 1 July 2007

Displacement sensor based on grating imaging with a cylindrical lens array and a phase grating

Toru Oka, Yoichi Ohmura, Hajime Nakajima, Toshiro Nakashima, Wei Gao, Kazuhiro Hane, Satoshi Kiyono

OE, Vol. 46, Issue 07, 073603, (July 2007) https://doi.org/10.1117/12.10.1117/1.2753185

KEYWORDS: Sensors, Distortion, Modulation transfer functions, Spatial frequencies, Imaging systems, Optical transfer functions, Point spread functions, Optical engineering, Signal to noise ratio, Prototyping

Read Abstract +